ORIGIN OF NANOSTRUCTURES IN SULPHIDE AND SELENIDE GLASSES
DOI:
https://doi.org/10.32782/pet-2021-2-5Keywords:
glasses alloy, inhomogeneities, intensity of scattered X-raysAbstract
Based on radiography data, the X-ray scattering curves of HgX-GeX2 (X-S, Se) X-ray alloys were compared with the diffraction patterns of polycrystalline Hg2GeSe4 (Hg4GeS6) alloys. In the amorphous matrix of the alloy based on compounds Hg2GeSe4 for selenide and Hg4GeS6 for sulfide systems dispersed inhomogeneities. For the selenide system, the size of the inhomogeneities is about 5 nm.
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